The model of alkylphenol micelles bound to respective antibodies on the solid surfaceTSARGORODSKAYA, A; LISHCHUK, S. V; NABOK, A et al.Colloids and surfaces. A, Physicochemical and engineering aspects. 2008, Vol 324, Num 1-3, pp 117-121, issn 0927-7757, 5 p.Article

Study of electroluminescence in porous silicon for sensing applicationsTSARGORODSKAYA, A; NABOK, A. V; RAY, A. K et al.IEE proceedings. Circuits, devices and systems. 2003, Vol 150, Num 4, pp 355-360, issn 1350-2409, 6 p.Article

Registration of T-2 mycotoxin with total internal reflection ellipsometry and QCM impedance methodsNABOK, A. V; TSARGORODSKAYA, A; HOLLOWAY, A et al.Biosensors & bioelectronics. 2007, Vol 22, Num 6, pp 885-890, issn 0956-5663, 6 p.Article

Total internal reflection ellipsometry and SPR detection of low molecular weight environmental toxinsNABOK, A. V; TSARGORODSKAYA, A; HASSAN, A. K et al.Applied surface science. 2005, Vol 246, Num 4, pp 381-386, issn 0169-4332, 6 p.Article

A phenomenon of the change in particle drift velocity direction in high-field electrophoresisPIKHITSA, P. V; TSARGORODSKAYA, A. B; KONTUSH, S. M et al.Journal of colloid and interface science. 2000, Vol 230, Num 2, pp 334-339, issn 0021-9797Article

Detection of β-amyloid peptide (1―16) and amyloid precursor protein (APP₇₇₀) using spectroscopic ellipsometry and QCM techniques: A step forward towards Alzheimers disease diagnosticsMUSTAFA, M. K; NABOK, A; PARKINSON, D et al.Biosensors & bioelectronics. 2010, Vol 26, Num 4, pp 1332-1336, issn 0956-5663, 5 p.Conference Paper

Electrostatically self-assembled films containing II-VI semiconductor nanoparticles : Optical and electrical propertiesSURYAJAYA; NABOK, A. V; TSARGORODSKAYA, A et al.Thin solid films. 2008, Vol 516, Num 24, pp 8917-8925, issn 0040-6090, 9 p.Conference Paper

Thin films of copper hexadecafluorophthalocyanine CuPcF16BASOVA, T; KOL'TSOV, E; HASSAN, A et al.Physica status solidi. B. Basic research. 2005, Vol 242, Num 4, pp 822-827, issn 0370-1972, 6 p.Conference Paper

Registration of low molecular weight environmental toxins with total internal reflection ellipsometryNABOK, A. V; TSARGORODSKAYA, A; HOLLOWAY, A et al.IEEE Sensors conference. 2004, isbn 0-7803-8692-2, 3Vol, vol 3, 1195-1198Conference Paper